Chemical Particle Counter: Ultra Chem 40 from Particle Measuring Systems

Description

Your products need reliable contamination monitoring. You need to detect the smallest particle possible. Now get both – sensitivity to 40 nm particles with the greatest reliability available on the market.

If your application requires measuring small particles in chemicals with high molecular scatter, UltraChem® 40 is the best tool for the job. NanoVision Technology® eliminates the competition between the light scattered by fluid molecules and particles. This makes 40 nm sizing possible for the first time.

Background and false counts are a thing of the past. The NanoVision Technology breakthrough ensures only information that matches a particle fingerprint is counted. The result: Data you can act on with confidence.